A selection of research activities with potential impact in ICT

“Relationship between materials and ICT”

ByN (Body as a network Node)
Space Softwarization

User Guide

Electronic and optoelectronic characterization for composite materials

Measurement of the transport properties of materials. Different measurement techniques of electrical and electronic properties will be made available: I-V, C-V characterizations, surface and volume resistivity measurements, photoconductivity and spectral photoemission, as well as the dielectric constant of the insulating materials and the modulus of elasticity:

  • Impedance spectroscopy
  • Frequency analysis
  • Measurements of photoconductance maps and LBIC maps
  • Thermoelectric measurements
  • Characterization under solar simulator in both static and dynamic conditions
  • Benchtop FE / SEM for fast analysis of devices and samples

Sample and device preparation

User access to skills, equipments and technologies for design, preparation and construction of devices – to be characterized (with the instrumentation of ISIS@MACH and with the ISIS neutron and muon beamlines – and samples to be prepared for the specific characterizetion – e.g. metallization of samples for SEM analysis, electrical contacting of devices, assembly of samples for spectroscopic and AFM analysis, microfabrication and laser ablation:

  • characterization of transistors and microelectronic devices (High frequency electronics and electronics at high integration VLSI)
  • electronic and optical properties of semiconductor nanostructures
  • Fully equipped chemical laboratories for synthesis
  • Multihead ink-jet printer, 3D printer
  • Precision mechanical instrumentation for bench for the micromechanical realization of devices
  • Pulsed Laser Deposition (NIR, VIS, UV)
  • Subpicosecond infrared laser for micromachining, marking, evaporation
  • Sputtering and thermal evaporator for metals
  • Ultrasonic disintegrator