Scanning Probes
mbe-es_fig1

Atomic Force Microscope (AFM) & Scanning Tunnelling Microscopy (STM)

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stm-sem_fig1

STM under SEM observation with laser excitation of the specimen

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npd_cover Nanomanipulated Piezoelectric Dynamometers (AFM and Piezoresistive Cantilevers)

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uhv-stm_fig2_stm-vessel_s

UHV STM with microscopic spectral analysis capabilities

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