A selection of research activities with potential impact in ICT
“Relationship between materials and ICT”
| ByN (Body as a network Node) | ||
| Space Softwarization |
Electronic and optoelectronic characterization for composite materials
Measurement of the transport properties of materials. Different measurement techniques of electrical and electronic properties will be made available: I-V, C-V characterizations, surface and volume resistivity measurements, photoconductivity and spectral photoemission, as well as the dielectric constant of the insulating materials and the modulus of elasticity:
- Impedance spectroscopy
- Frequency analysis
- Measurements of photoconductance maps and LBIC maps
- Thermoelectric measurements
- Characterization under solar simulator in both static and dynamic conditions
- Benchtop FE / SEM for fast analysis of devices and samples
Sample and device preparation
User access to skills, equipments and technologies for design, preparation and construction of devices – to be characterized (with the instrumentation of ISIS@MACH and with the ISIS neutron and muon beamlines – and samples to be prepared for the specific characterizetion – e.g. metallization of samples for SEM analysis, electrical contacting of devices, assembly of samples for spectroscopic and AFM analysis, microfabrication and laser ablation:
- characterization of transistors and microelectronic devices (High frequency electronics and electronics at high integration VLSI)
- electronic and optical properties of semiconductor nanostructures
- Fully equipped chemical laboratories for synthesis
- Multihead ink-jet printer, 3D printer
- Precision mechanical instrumentation for bench for the micromechanical realization of devices
- Pulsed Laser Deposition (NIR, VIS, UV)
- Subpicosecond infrared laser for micromachining, marking, evaporation
- Sputtering and thermal evaporator for metals
- Ultrasonic disintegrator