Pulsed Laser Ablation and Pulsed Laser Depostion
	STM under SEM observation with laser excitation of the specimen
	Nanomanipulated Piezoelectric Dynamometers (AFM and Piezoresistive Cantilevers)
	UHV STM with microscopic spectral analysis capabilities
	Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray Spectrometry (EDS)
	Atomic Force Microscope (AFM) & Scanning Tunnelling Microscopy (STM)
	Molecular Beam Epitaxy & Electron Spectroscopy